产品信息
Products
产品信息
低温恒温器
For X-Ray Diffraction Measurement
特征
使用X射线全面分析样本组织
以往的X射线测量设备只能在固定温度下对样本进行测定，然而本设备能够在极低温到室温之间自由变化，进行测量。
标准规格
| Model | CRT-A020-S700 | CRT-C020-S700 | CRT-C010-S700 |
| Coldhead/Compressor | HE05/UW404 | D510/SW115 | D105/SW112 |
| Ultimate Temperature | 4K | 12K | 12K |
| Temperature Controllable Range | 4K to 300K ±0.2K | 12K to 300K ±0.2K | 12K to 300K ±0.2K |
| Sample Dimensions | 10×10×t1 mm | ||
| Number of Samples | 1 | ||
| Accessories | Evacuation valve, Heater for temperature control, Cryogenic thermometer (for temperature control / measurement), Coldhead rotation system | ||
*It may vary depending on the operating condition.
CRYOSTAT For X-Ray Diffraction Measurement[PDF:326KB]
